METTLER TOLEDO receives POWTECH award for Top Innovation in Particle Characterization and Material Sciences

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Dr. Markus Adamczyk, representing METTLER TOLEDO, accepts the award for top innovation in particle characterization and material science from Frank Jablonski and Gerd Kielburger

A couple of weeks ago, I posted an article about my colleagues’ attendance at POWTECH in Nuremberg. I was recently informed that while in Nuremberg, they accepted an award for this year’s most outstanding innovation in the field of Particle Characterization and Material Science at POWTECH. I thought I would share some of the details with you:

At the POWTECH 2010 Exhibition in Nuremberg, METTLER TOLEDO was presented an award by POWTECH/TechnoPharm for the top innovation in Particle Characterization and Material Sciences for the recently introduced FBRM® C35. The C35 provides the ability to monitor particles in real time as they actually exist in high-shear granulators and other extreme processing environments.

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Dr. Markus Adamczyk and Dr. Jochen Schoell celebrating the POWTECH award for 2010's top innovation in Particle Characterization and Material Science

FBRM (Focused Beam Reflectance Measurement) is a well-established Process Analytical Technology that has been used for over 20 years for precise and sensitive measurement of particles and particle structures as they actually exist in process. FBRM has been widely used for particle characterization and optimization of processes such as crystallization and flocculation in the pharmaceutical and chemical processing industries. (Click here to learn more about how Focused Beam Reflectance Measurement works.)

High-shear granulation has always posed a particularly challenging environment for any inline measurement technology due to the tendency of wetted granules to adhere to virtually any surface. The FBRM® C35 is the first technology that has directly addressed the need for inline measurements with a solution for avoiding probe fouling.

The FBRM® C35 features the award winning (and patent pending) innovation of a mechanical system to ensure the probe’s sapphire window remains free from adhesive granules. This solution was featured in one of the technical presentations presented by Ben Smith and Jochen Schoell at the World Congress in Particle Technology conference that was held in conjunction with the POWTECH conference.

Take a look at some images from the FBRM C35 being used in high-shear wet granulation and in roller compaction applications.